عنوان البحث(Papers / Research Title)
Electronic structure of Gallium Arsenide under pressure
الناشر \ المحرر \ الكاتب (Author / Editor / Publisher)
حمد رحمن جبر البركاوي
Citation Information
حمد,رحمن,جبر,البركاوي ,Electronic structure of Gallium Arsenide under pressure , Time 28/01/2013 08:37:13 : كلية التربية للعلوم الصرفة
وصف الابستركت (Abstract)
بحث منشور
الوصف الكامل (Full Abstract)
SUMMARY We present the structural and electronic properties of GaAs under the effect of pressure using large unit cell method within the framework of intermediate neglect of differential overlap (LUC-INDO) calculations. It is found that the results are consistent with the available experimental data and other theoretical results. Energy gap, valence bandwidth, bulk modulus and cohesive energy increase with increasing pressure, while the conduction bandwidth decreases. All the aforementioned properties are obtained by selecting empirical parameter sets for LUC-INDO calculation.
Key words: Electronic structure, gallium arsenide, pressure, LUC-INDO, Energy gap, valence bandwidth, bulk modulus and cohesive energy.
Introduction Theoretical studies of properties continue to be of great importance. Among these are the complete (CNDO) and intermediate (INDO) neglect of differential overlap. The extension of the semi-empirical calculations to solids had begun in approximately one decade after its application to molecules (9). The extension made use of the large unit cell (LUC) method to implement periodic boundary of solid. LUC-INDO calculations have the ability to include large number of atoms including surfaces, interstitials, or vacancies. Previous LUC-INDO calculations for semiconductors had focused on diamond and silicon (14, 6). Other calculations applied the method to F centers (8) titanium oxides (10), etc. These methods were suggested in the seventies of the last century to overcome computational problems of ab initio methods for molecules (13). Vast literature accumulated on the use of semi-empirical methods in solid-state problems (20).
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